Ming-Dou Ker, Tzu-Ming Wang, Hung-Tai Liao. 2xVDD-tolerant crystal oscillator circuit realized with 1xVDD CMOS devices without gate-oxide reliability issue. In International Symposium on Circuits and Systems (ISCAS 2008), 18-21 May 2008, Sheraton Seattle Hotel, Seattle, Washington, USA. pages 820-823, IEEE, 2008. [doi]
Abstract is missing.