Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
A. Kerber, L. Pantisano, A. Veloso, Guido Groeseneken, M. Kerber. Reliability screening of high-k dielectrics based on voltage ramp stress. Microelectronics Reliability, 47(4-5):513-517, 2007. [doi]
Abstract is missing.