Testable Design and Testing of Micro-Electro-Fluidic Arrays

Hans G. Kerkhoff, Mustafa Acar. Testable Design and Testing of Micro-Electro-Fluidic Arrays. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 403-409, IEEE Computer Society, 2003. [doi]

Abstract

Abstract is missing.