Statistical modeling and post manufacturing configuration for scaled analog CMOS - researchr publication authors

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Gokce Keskin, Jonathan Proesel, Larry T. Pileggi. Statistical modeling and post manufacturing configuration for scaled analog CMOS. In Jacqueline Snyder, Rakesh Patel, Tom Andre, editors, IEEE Custom Integrated Circuits Conference, CICC 2010, San Jose, California, USA, 19-22 September, 2010, Proceedings. pages 1-4, IEEE, 2010. [doi]

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