Gokce Keskin, Jonathan Proesel, Larry T. Pileggi. Statistical modeling and post manufacturing configuration for scaled analog CMOS. In Jacqueline Snyder, Rakesh Patel, Tom Andre, editors, IEEE Custom Integrated Circuits Conference, CICC 2010, San Jose, California, USA, 19-22 September, 2010, Proceedings. pages 1-4, IEEE, 2010. [doi]
@inproceedings{KeskinPP10,
title = {Statistical modeling and post manufacturing configuration for scaled analog CMOS},
author = {Gokce Keskin and Jonathan Proesel and Larry T. Pileggi},
year = {2010},
doi = {10.1109/CICC.2010.5617625},
url = {http://dx.doi.org/10.1109/CICC.2010.5617625},
researchr = {https://researchr.org/publication/KeskinPP10},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE Custom Integrated Circuits Conference, CICC 2010, San Jose, California, USA, 19-22 September, 2010, Proceedings},
editor = {Jacqueline Snyder and Rakesh Patel and Tom Andre},
publisher = {IEEE},
isbn = {978-1-4244-5758-8},
}