EM-net: Deep learning for electron microscopy image segmentation

Afshin Khadangi, Thomas Boudier, Vijay Rajagopal. EM-net: Deep learning for electron microscopy image segmentation. In 25th International Conference on Pattern Recognition, ICPR 2020, Virtual Event / Milan, Italy, January 10-15, 2021. pages 31-38, IEEE, 2020. [doi]

Abstract

Abstract is missing.