Bayesian inference for mining semiconductor manufacturing big data for yield enhancement and smart production to empower industry 4.0

Marzieh Khakifirooz, Chen-Fu Chien, Ying-Jen Chen. Bayesian inference for mining semiconductor manufacturing big data for yield enhancement and smart production to empower industry 4.0. Appl. Soft Comput., 68:990-999, 2018. [doi]

Abstract

Abstract is missing.