Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation

Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg. Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation. IEICE Electronic Express, 13(17):20160627, 2016. [doi]

Abstract

Abstract is missing.