Nguyen Ngoc Mai Khanh, Shigeru Nakajima, Tetsuya Iizuka, Yoshio Mita, Kunihiro Asada. Noninvasive Localization of IGBT Faults by High-Sensitivity Magnetic Probe With RF Stimulation. IEEE T. Instrumentation and Measurement, 67(4):745-753, 2018. [doi]
Abstract is missing.