Policies for probe-wear leveling in MEMS-based storage devices

Mohammed G. Khatib, Pieter H. Hartel. Policies for probe-wear leveling in MEMS-based storage devices. In 17th Annual Meeting of the IEEE/ACM International Symposium on Modelling, Analysis and Simulation of Computer and Telecommunication Systems, MASCOTS 2009, September 21-23, 2009, South Kensington Campus, Imperial College London. pages 1-10, IEEE, 2009. [doi]

Abstract

Abstract is missing.