Wu Woan Kim. Parallel Testing Method by Partitioning Circuit Based on the Exhaustive Test. In Antonio Laganà , Marina L. Gavrilova, Vipin Kumar, Youngsong Mun, Chih Jeng Kenneth Tan, Osvaldo Gervasi, editors, Computational Science and Its Applications - ICCSA 2004, International Conference, Assisi, Italy, May 14-17, 2004, Proceedings, Part II. Volume 3044 of Lecture Notes in Computer Science, pages 262-271, Springer, 2004. [doi]
Abstract is missing.