Hyunjin Kim, Jacob A. Abraham. On-chip source synchronous interface timing test scheme with calibration. In Wolfgang Rosenstiel, Lothar Thiele, editors, 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012. pages 1146-1149, IEEE, 2012. [doi]
@inproceedings{KimA12,
title = {On-chip source synchronous interface timing test scheme with calibration},
author = {Hyunjin Kim and Jacob A. Abraham},
year = {2012},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6176574},
researchr = {https://researchr.org/publication/KimA12},
cites = {0},
citedby = {0},
pages = {1146-1149},
booktitle = {2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012},
editor = {Wolfgang Rosenstiel and Lothar Thiele},
publisher = {IEEE},
isbn = {978-1-4577-2145-8},
}