A Built-In Self-Test scheme for high speed I/O using cycle-by-cycle edge control

Hyunjin Kim, Jaeyong Chung, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo. A Built-In Self-Test scheme for high speed I/O using cycle-by-cycle edge control. In 15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic. pages 145-150, IEEE Computer Society, 2010. [doi]

Abstract

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