Low-cost diagnosis of defects in MCM substrate interconnections

Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan. Low-cost diagnosis of defects in MCM substrate interconnections. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 260-265, IEEE Computer Society, 1996. [doi]

Abstract

Abstract is missing.