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An analysis of the delay defect detection capability of the ECR test method

Seonki Kim, Sreejit Chakravarty, Bapiraju Vinnakota. An analysis of the delay defect detection capability of the ECR test method. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 1060-1069, IEEE Computer Society, 2000.

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