Sang-Woon Kim, Robert P. W. Duin. On Improving Dissimilarity-Based Classifications Using a Statistical Similarity Measure. In Isabelle Bloch, Roberto M. Cesar, editors, Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 15th Iberoamerican Congress on Pattern Recognition, CIARP 2010, Sao Paulo, Brazil, November 8-11, 2010. Proceedings. Volume 6419 of Lecture Notes in Computer Science, pages 418-425, Springer, 2010. [doi]
Abstract is missing.