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Dissimilarity-Based Classifications in Eigenspaces

Sang-Woon Kim, Robert P. W. Duin. Dissimilarity-Based Classifications in Eigenspaces. In César San Martín, Sang-Woon Kim, editors, Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 16th Iberoamerican Congress, CIARP 2011, Pucón, Chile, November 15-18, 2011. Proceedings. Volume 7042 of Lecture Notes in Computer Science, pages 425-432, Springer, 2011. [doi]

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