Jeewoong Kim, Shin Hong. Poster: BugOss: A Regression Bug Benchmark for Empirical Study of Regression Fuzzing Techniques. In IEEE Conference on Software Testing, Verification and Validation, ICST 2023, Dublin, Ireland, April 16-20, 2023. pages 470-473, IEEE, 2023. [doi]
@inproceedings{KimH23-5,
title = {Poster: BugOss: A Regression Bug Benchmark for Empirical Study of Regression Fuzzing Techniques},
author = {Jeewoong Kim and Shin Hong},
year = {2023},
doi = {10.1109/ICST57152.2023.00053},
url = {https://doi.org/10.1109/ICST57152.2023.00053},
researchr = {https://researchr.org/publication/KimH23-5},
cites = {0},
citedby = {0},
pages = {470-473},
booktitle = {IEEE Conference on Software Testing, Verification and Validation, ICST 2023, Dublin, Ireland, April 16-20, 2023},
publisher = {IEEE},
isbn = {978-1-6654-5666-1},
}