Design and Measurement of a 1-kBit eFuse One-Time Programmable Memory IP Based on a BCD Process

Du-Hwi Kim, Ji-Hye Jang, Liyan Jin, Jae-Hyung Lee, Pan-Bong Ha, Young-Hee Kim. Design and Measurement of a 1-kBit eFuse One-Time Programmable Memory IP Based on a BCD Process. IEICE Transactions, 93-C(8):1365-1370, 2010. [doi]

Abstract

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