Min-Jung Kim, Ho Kyung Kim. Effects of temperature and span amplitude on fretting corrosion behavior of tin-plated electrical contacts. Microelectronics Reliability, 69:80-87, 2017. [doi]
@article{KimK17-3,
title = {Effects of temperature and span amplitude on fretting corrosion behavior of tin-plated electrical contacts},
author = {Min-Jung Kim and Ho Kyung Kim},
year = {2017},
doi = {10.1016/j.microrel.2016.12.014},
url = {http://dx.doi.org/10.1016/j.microrel.2016.12.014},
researchr = {https://researchr.org/publication/KimK17-3},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {69},
pages = {80-87},
}