Pattern Recognition through Mathematical Feature analysis and Wavelet Transform

Cheol-Ki Kim, In-Sil Kwak, Eui-Young Cha, Tae-Soo Chon. Pattern Recognition through Mathematical Feature analysis and Wavelet Transform. In Hamid R. Arabnia, Youngsong Mun, editors, Proceedings of the International Conference on Artificial Intelligence, IC-AI 02, June 24 - 27, 2002, Las Vegas, Nevada, USA, Volume 2. pages 656-662, CSREA Press, 2002.

Abstract

Abstract is missing.