Jeongho Kim, Taejune Kim, Jeonghyeon Kim, Simon S. Woo. Evading Deepfake Detectors via High Quality Face Pre-Processing Methods. In 26th International Conference on Pattern Recognition, ICPR 2022, Montreal, QC, Canada, August 21-25, 2022. pages 1937-1944, IEEE, 2022. [doi]
Abstract is missing.