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Fatigue analysis of high-speed photodiode submodule by using FEM

K. S. Kim, H. I. Kim, C. H. Yu, E. G. Chang. Fatigue analysis of high-speed photodiode submodule by using FEM. Microelectronics Reliability, 44(1):167-171, 2004. [doi]

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K. S. Kim

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H. I. Kim

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C. H. Yu

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E. G. Chang

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