Cold- and hot-switching lifetime characterizations of ohmic-contact RF MEMS switches

Jong Man Kim, Sanghyo Lee, Chang-Wook Baek, Youngwoo Kwon, Yong-Kweon Kim. Cold- and hot-switching lifetime characterizations of ohmic-contact RF MEMS switches. IEICE Electronic Express, 5(11):418-423, 2008. [doi]

Abstract

Abstract is missing.