Jong Man Kim, Sanghyo Lee, Chang-Wook Baek, Youngwoo Kwon, Yong-Kweon Kim. Cold- and hot-switching lifetime characterizations of ohmic-contact RF MEMS switches. IEICE Electronic Express, 5(11):418-423, 2008. [doi]
@article{KimLBKK08,
title = {Cold- and hot-switching lifetime characterizations of ohmic-contact RF MEMS switches},
author = {Jong Man Kim and Sanghyo Lee and Chang-Wook Baek and Youngwoo Kwon and Yong-Kweon Kim},
year = {2008},
doi = {10.1587/elex.5.418},
url = {http://dx.doi.org/10.1587/elex.5.418},
researchr = {https://researchr.org/publication/KimLBKK08},
cites = {0},
citedby = {0},
journal = {IEICE Electronic Express},
volume = {5},
number = {11},
pages = {418-423},
}