Dae-Hyun Kim, Linda S. Milor. ECC-ASPIRIN: An ECC-assisted post-package repair scheme for aging errors in DRAMs. In 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016. pages 1-6, IEEE Computer Society, 2016. [doi]
Abstract is missing.