Hyung-Ock Kim, Youngsoo Shin. Analysis and optimization of gate leakage current of power gating circuits. In Fumiyasu Hirose, editor, Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, Yokohama, Japan, January 24-27, 2006. pages 565-569, IEEE, 2006. [doi]
Abstract is missing.