Joonyoung Kim, João P. Marques Silva, Karem A. Sakallah. Satisfiability-Based Functional Delay Fault Testing. In L. Miguel Silveira, Srinivas Devadas, Ricardo Augusto da Luz Reis, editors, VLSI: Systems on a Chip, IFIP TC10/WG10.5 Tenth International Conference on Very Large Scale Integration (VLSI 99), December 1-4, 1999, Lisbon, Portugal. Volume 162 of IFIP Conference Proceedings, pages 362-372, Kluwer, 1999.
Abstract is missing.