Andrew Kim, Ernest Y. Wu, Baozhen Li, Barry P. Linder. Transformation of Ramped Current Stress VBDto Constant Voltage Stress TDDB TBD. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-5, IEEE, 2019. [doi]
Abstract is missing.