Youbean Kim, Myung-Hoon Yang, Yong Lee 0002, Sungho Kang. A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 230-235, IEEE Computer Society, 2005. [doi]
Abstract is missing.