Sunghun Kim, Hongyu Zhang, Rongxin Wu, Liang Gong. Dealing with noise in defect prediction. In Richard N. Taylor, Harald Gall, Nenad Medvidovic, editors, Proceedings of the 33rd International Conference on Software Engineering, ICSE 2011, Waikiki, Honolulu , HI, USA, May 21-28, 2011. pages 481-490, ACM, 2011. [doi]
Abstract is missing.