Adam B. Kinsman, Jonathan I. Hewitt, Nicola Nicolici. Embedded Compact Deterministic Test for IP-Protected Cores. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 519, IEEE Computer Society, 2003. [doi]
Abstract is missing.