Tests for Resistive and Capacitive Defects in Address Decoders

Matthias Klaus, A. J. van de Goor. Tests for Resistive and Capacitive Defects in Address Decoders. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 31-36, IEEE Computer Society, 2001. [doi]

Abstract

Abstract is missing.