Veit B. Kleeberger, Martin Barke, Christoph Werner, Doris Schmitt-Landsiedel, Ulf Schlichtmann. A compact model for NBTI degradation and recovery under use-profile variations and its application to aging analysis of digital integrated circuits. Microelectronics Reliability, 54(6-7):1083-1089, 2014. [doi]
Abstract is missing.