Tihomir Knezevic, Lis K. Nanver, Tomislav Suligoj. Perimeter effects from interfaces in ultra-thin layers deposited on nanometer-deep p+n silicon junctions. In Petar Biljanovic, Marko Koricic, Karolj Skala, Tihana Galinac Grbac, Marina Cicin-Sain, Vlado Sruk, Slobodan Ribaric, Stjepan Gros, Boris Vrdoljak, Mladen Mauher, Edvard Tijan, Filip Hormot, editors, 40th International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2017, Opatija, Croatia, May 22-26, 2017. pages 72-76, IEEE, 2017. [doi]
Abstract is missing.