RTL Scan Design for Skewed-Load At-speed Test under Power Constraints

Ho Fai Ko, Nicola Nicolici. RTL Scan Design for Skewed-Load At-speed Test under Power Constraints. In 24th International Conference on Computer Design (ICCD 2006), 1-4 October 2006, San Jose, CA, USA. pages 237-242, IEEE, 2006. [doi]

Abstract

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