Sreekumar V. Kodakara, Deepak Mathaikutty, Ajit Dingankar, Sandeep K. Shukla, David J. Lilja. Model Based Test Generation for Microprocessor Architecture Validation. In 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India. pages 465-472, IEEE Computer Society, 2007. [doi]
Abstract is missing.