Bernd Koenemann, J. Monzel, T. Powell, N. Saxena, K. Wagner. BIST: Advantages or Limitations?. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 366-367, IEEE Computer Society, 1996. [doi]
Abstract is missing.