T. Kogan, Y. Abotbol, G. Boschi, Gurgen Harutyunyan, N. Martirosyan, Yervant Zorian. Advanced Uniformed Test Approach For Automotive SoCs. In IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018. pages 1-10, IEEE, 2018. [doi]
Abstract is missing.