Omid Kohannim, Derrek P. Hibar, Jason L. Stein, Neda Jahanshad, Clifford R. Jack, Michael Weiner, Arthur W. Toga, Paul M. Thompson. Boosting power to detect genetic associations in imaging using multi-locus, genome-wide scans and ridge regression. In Proceedings of the 8th IEEE International Symposium on Biomedical Imaging: From Nano to Macro, ISBI 2011, March 30 - April 2, 2011, Chicago, Illinois, USA. pages 1855-1859, IEEE, 2011. [doi]
Abstract is missing.