Dominik Kohl, Thomas Riel, Rudolf Saathof, Jürgen Steininger, Georg Schitter. Auto-tuning PI controller for surface tracking in atomic force microscopy - a practical approach. In 2016 American Control Conference, ACC 2016, Boston, MA, USA, July 6-8, 2016. pages 7396-7401, IEEE, 2016. [doi]
Abstract is missing.