Test Setup for Dynamic ON-State Resistance Measurement of High- and Low-Voltage GaN-HEMTs Under Hard and Soft Switching Operations

Benedikt Kohlhepp, Daniel Kübrich, Marvin Tannhäuser, Andreas Hoffmann, Thomas Dürbaum. Test Setup for Dynamic ON-State Resistance Measurement of High- and Low-Voltage GaN-HEMTs Under Hard and Soft Switching Operations. IEEE T. Instrumentation and Measurement, 69(10):7740-7751, 2020. [doi]

Abstract

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