Fast, Layout-Aware Validation of Test-Vectors for Nanometer-Related Timing Failures

Aman Kokrady, C. P. Ravikumar. Fast, Layout-Aware Validation of Test-Vectors for Nanometer-Related Timing Failures. In 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India. pages 597, IEEE Computer Society, 2004. [doi]

Abstract

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