Aman Kokrady, C. P. Ravikumar, Nitin Chandrachoodan. Memory Yield Improvement through Multiple Test Sequences and Application-Aware Fault Models. In 21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India. pages 169-174, IEEE Computer Society, 2008. [doi]
Abstract is missing.