A Practical Analog BIST Cooperated with an LSI Tester

Takanori Komuro, Naoto Hayasaka, Haruo Kobayashi, Hiroshi Sakayori. A Practical Analog BIST Cooperated with an LSI Tester. IEICE Transactions, 89-A(2):465-468, 2006. [doi]

Abstract

Abstract is missing.