Preliminary results of storage accelerated aging test on InP/InGaAs DHBT

G. A. Koné, B. Grandchamp, C. Hainaut, F. Marc, C. Maneux, Nathalie Labat, T. Zimmer, Virginie Nodjiadjim, Jean Godin. Preliminary results of storage accelerated aging test on InP/InGaAs DHBT. Microelectronics Reliability, 50(9-11):1548-1553, 2010. [doi]

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