Joonho Kong, Sung Woo Chung. Exploiting narrow-width values for process variation-tolerant 3-D microprocessors. In Patrick Groeneveld, Donatella Sciuto, Soha Hassoun, editors, The 49th Annual Design Automation Conference 2012, DAC '12, San Francisco, CA, USA, June 3-7, 2012. pages 1197-1206, ACM, 2012. [doi]
Abstract is missing.