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    The I Test: A New Test for Subscript Data Dependence

    Xiangyun Kong, David Klappholz, Kleanthis Psarris. The I Test: A New Test for Subscript Data Dependence. In David A. Padua, editor, Proceedings of the 1990 International Conference on Parallel Processing, Volume 2: Software, Urbana-Champaign, IL, August 1990. pages 204-211, Pennsylvania State University Press, 1990.

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