Fine-Grain Voltage Tuned Cache Architecture for Yield Management Under Process Variations

Joonho Kong, Yan Pan, Serkan Ozdemir, Anitha Mohan, Gokhan Memik, Sung Woo Chung. Fine-Grain Voltage Tuned Cache Architecture for Yield Management Under Process Variations. IEEE Trans. VLSI Syst., 20(8):1532-1536, 2012. [doi]

Abstract

Abstract is missing.