Ivo Koren, Ben Schuffenhauer, Frank Demmerle, Frank Neugebauer, Gert Pfahl, Dirk Rautmann. Multi-site test of RF transceivers on low-cost digital ATE. In Bill Eklow, R. D. (Shawn) Blanton, editors, 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. pages 1-10, IEEE, 2011. [doi]
Abstract is missing.